Advanced Low-Frequency Noise Analyzer-sawan实验室

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Advanced Low-Frequency Noise Analyzer

Introduction

The E4727A Advanced Low-Frequency Noise Analyzer enables fast, accurate and repeatable low-frequency noise (LFN) measurements on numerous device types. Now, thanks to tight integration with Keysight’s WaferPro Express software, device modeling and characterization engineers can now add noise measurements to a larger suite that includes high-speed DC, capacitance and RF S-parameter measurements, all the while automating wafer prober control.

Characteristics

Device Name	Advanced Low-Frequency Noise Analyzer
Model	Keysight E4727A
Characteristics	-Automated RTN and l/f noise measurement and data analysis -Supported test device types: BJT, FETs, diodes, resistors and circuits (operational amplifiers, comparators, etc.) -Wafer mapping -Multiple data overlapping display.System noise floor display and dataclipping -1/f (flicker) noise measurement: The analyzed frequency range is from 0.03 Hz to 40 MHz.The current/voltage/power range reaches up to 0.1 A/200 V/10 W respectively. -Random Telegraph Signal Noise (RTS or RTN) measurement: Time-domain representation of noise. Histogram of current and voltage.Minimum time step of 2.5 ns. Maximum sampling size of 16 M points.

Device Name

Advanced Low-Frequency Noise Analyzer

Model

Keysight E4727A

Characteristics

-Automated RTN and l/f noise measurement and data analysis

-Supported test device types: BJT, FETs, diodes, resistors and circuits (operational amplifiers, comparators, etc.)

-Wafer mapping

-Multiple data overlapping display.System noise floor display and dataclipping

-1/f (flicker) noise measurement: The analyzed frequency range is from 0.03 Hz to 40 MHz.The current/voltage/power range reaches up to 0.1 A/200 V/10 W respectively.

-Random Telegraph Signal Noise (RTS or RTN) measurement: Time-domain representation of noise. Histogram of current and voltage.Minimum time step of 2.5 ns. Maximum sampling size of 16 M points.