技术资料：https://iscps.westlake.edu.cn/info/1131/1302.htm

送样要求：液体，粉末，薄膜，晶片，玻璃等。样品尺寸参照仪器详细参数

Instrument No.LHA19040019Specification

ManufactureShimadzuModelUV-3600 Plus

Made inJapanClassification No.

Location4#220Manufacture date

Purchase Date5/03/2019Internet access time25/06/2019

Main Technical specifications

Wavelength range: 185~3300nm

Wavelength accuracy: UV、VIS：±0.2nm NIR：±0.8nm

Wavelength repeatability: UV、VIS：±0.08nm NIR：±0.32nm

Wavelength scanning speed:

1. Wavelength moving speed : UV、VIS：about 18000nm/min NIR：about 70000nm/min；

2. Wavelength scanning speed: UV、VIS：about 4500nm/min NIR-PMT/InGaAs：about 9000nm/min NIR-PbS：about 4000nm/min

Wavelength sampling interval: 0.01～5nm

Light switching wavelength: synchronization automatically switch 282.0 nm~393.0 nm（0.1nm unit）

Band width: UV、VIS：0.1/ 0.2/ 0.5/ 1/ 2/ 3/5/8nm 8 grade switch

NIR：0.2/ 0.5/ 1/ 2/ 3/5/8/12/20/32nm 10 grade switch

Resolution: 0.1nm

Stray light: below 0.00008% (220nm,Nal )

0.00005% below (340nm, NaNO2)

0.0005% below (1420nm, H2O)

0.005% below (2365nm, CHCl3) "

Measurement mode: Dual beam system

Measurement type: Absorbance（Abs），T（％），Reflectivity，Energy（E）

Absorbance Range :：-6~6 Abs

Photometric accuracy：±0.003Abs(1Abs) ±0.002Abs(0.5Abs)

Above tested by NIST930D standard filter"

Photometric repeatability：±0.0008Abs.(0～0.5Abs)，±0.0016Abs(0.5～1.0Abs)，

Maximum deviation of 5 measurements

Noise 0.00005Abs RMS (500nm)

0.00008Abs below (900nm)

0.00003Abs below (1500nm) slit 2nm，RMS value at 1 second response

Baseline flatness ±0.004Abs（185-200nm）

±0.001Abs（200-3000nm）

±0.005Abs（3000-3300nm）

Drifting：less than 0.0002Abs/h (Power on for 2 hours, 500nm, 1 second)

Baseline correction: automatic correction by computer

Light source: 50W halogen lamp and deuterium lamp (socket type)

Detector UV/VIS：PMT R-928

NIR：InGaAs photodiode and cooled PbS photoconductive elements

Main functions and features

The measurement range is up to 3300 nm, equipped with integrating sphere accessory for solid and thin film absorbance, transmission and reflection testing. It’s widely used in inorganic metal ion analysis, organic compound analysis, organic compound qualitative and quantitative analysis, organic compound structure analysis, and various equilibrium constants, dissociation constants

Accessories and configuration

1. Integrating sphere: wavelength range: 220-2600nm, 60mm inner diameter, PMT/InGaAs/PbS detector

2. Film holder: used for transmission measurement of thinner samples, such as film and filter. Sample size: minimum W 16 × H 32 mm, maximum W 80 × H 40 × D 20 mm

3. Rotating film holder: this film holder enables the sample (centered on the optical axis) to rotate on a plane. Polarizer I, II and III are available. Measurement sample size: W 33 × H 30 × D 2 mm

4. Specular reflector (5° incident angle): this attachment is used for relative specular reflectance testing. The maximum sample size is W 140 × H 160 × D 10 mm, and the minimum sample diameter is 7mm.

5. Micro sample holder with aperture: semi-micro and micro cuvette up to 10mm long and 4mm wide, aperture width can be adjusted continuously

6. Micro sample holder (for 60mm integrating sphere) : for placing 5-10mm square or round samples with thickness of 1-5mm.The sample is fixed through clamps at the top and bottom.
   

Informations:https://iscps.westlake.edu.cn/info/1131/1302.htm

Sample requirements: liquid, powder, film, wafer, glass, etc. The sample size refer to the part of instrument details